Biography
John W. Lee focuses his practice on intellectual property litigation, with an emphasis on patent litigation involving cutting-edge technologies. John brings more than a decade of technical insight from his time at the U.S. Patent and Trademark Office (“USPTO”), where he held various roles over the course of more than 10 years, including serving as a primary examiner and examination specialist. At the USPTO, John examined high-profile patent applications in advanced technologies, including machine learning, neural networks, autonomous vehicles, image processing, biometrics, and biomedical applications. In recognition of his contributions, the USPTO awarded him the Career Achievement Award and the Bronze Medal Award.
During law school, John served as a judicial intern to the Honorable Clark S. Cheney, Chief Judge of the U.S. International Trade Commission (“ITC”), and as a law clerk in the Office of Unfair Import Investigations at ITC. John also served as a staff editor for the American Intellectual Property Law Association Quarterly Journal.
Credentials
Admissions
- District of Columbia
Education
- George Washington University Law School, JD
- Texas A&M University, BS
- Korean
